3D ORM Sensor

The patent-registered MTS Sensor technology quantifies size and number of particles in originally concentrated dispersion based on the optic measurement of back reflection in connection with ToF (Time of Flight) technology. The influence of process parameters on the product will be identified fast and effectively. In contrast to normal particle analyzers MTS Sensors work with a Self Selecting Focus which guarantees the highest resolution of particles in the focal point.

MTS sensors use the patent-registered 3D ORM technology with its ToF method as a basis. A focused laser beam moves circular above a particle flow. The size is defined by the period of time that is necessary to scan the focused particles.
The sum of the data is used to create a statistical firm distribution.
The special kind of the selective 3D ORM measuring room and the combination with a electronically evaluation of the back reflection pulse are the particular characteristic of the 3D ORM technology.

In the statistical evaluation are just particles that are directly in the focus. Particles and drops outside the focus are excluded from the statistical evaluation by the patented optic.

The focus

Rotating Multi Depth Focus

Additional to the rotating movement of the laser beam the focus moves vertically in the medium. The patented technology lets only particles be statistically evaluated, which come directly in the spiral focus. Particles and droplets which are outside of the focus, are precluded from the statistical collector through the patented optics.
The knowledge of the position of the focus inside the particle stream allows an advanced electronic to evaluate the measuring signals.

Selective Multi Depth Focus

Selective Multi Depth Focus Reflection Measurement (SMDF 3D ORM), because of the signals the measurement range will be automatically adapted of the crystal size in the range of <0,5 to 2000 µm

Shape factors and shape depended signals will be evaluate by an advanced electronic
The permanent adjustment of the focus depth allows a 10 times larger dynamic size range, from which focused particles are detected.
High sensitive optical receiver, which results into high signals gain, due to this, a very high count rate will be gained, resulting in less duration time needed to receive a statistically stable measurement results.
An external oscilloscope allows viewing the raw signals for R&D.

Multi Capture Signal Analyse

System for shape detection > 1 µm and depth focus and selective scanning based on a 10mW laser system Surface structures are detected as signals and evaluate by the electronic. Raw signals are available at the sensor for R&D application. So it is possible to realize the original particle system and their morphology.
Additional to SMDF, every shape signal will be saved in a data base.
Application: Because precise detection of every single particle it is possible to identify e.g. seed crystals, coatings, microcapsules, evaluation of crystal cleanness and so on..
All particle signals and shape signals will evaluate regarding of roughness and surface.